Simon Spencer

In the United States, there are 119 individuals named Simon Spencer spread across 36 states, with the largest populations residing in California, Florida, New York.

Public information about Simon Spencer

Resumes

E-Commerce Professional

Location:

Addison, IL

Industry:

Electrical/Electronic Manufacturing

Simon Spencer - Madrid, IA

Work:

Champsterdam S.L. 2009 to 2000
Founder and Managing Director

Education:

University of Buckinghamshire
BA in European Business Studies

Skills:

Graphic design, HTML programming, bilingual English & Spanish, strategic planning, creative thinking

Senior Software Engineer

Location:

Sunnyvale, CA

Industry:

Computer Software

Work:

Netflix
Senior Software Engineer Amazon
Software Engineer Mokpo English Village Dec 2008 - Jan 2010
English Teacher X-On Oct 2008 - Dec 2008
Software Developer

Education:

University of Edinburgh School of Philosophy, Psychology and Language Sciences 2004 - 2008
Bachelor of Engineering, Bachelors, Software Engineering

Skills:

Scalability, Python, Java, Subversion, Junit, Tdd, Software Engineering, Git, Bash, Agile Methodologies, Eclipse, Oop, Big Data, Test Driven Development, Scrum, Creative Problem Solving, Rtb, Amazon Web Services, Object Oriented Design

Interests:

Board Building
Open Source Code
Kitesurfing
Longboarding
Kiteboarding
Sailing
Surfing

Senior Marketing Manager

Location:

1423 southeast 53Rd Ave, Portland, OR 97215

Industry:

Marketing And Advertising

Work:

Lead Lizard - Portland, Oregon Area since Nov 2012
Digital Solutions Architect Tall Palms Creative - Salem, Oregon since Sep 2011
Web Designer Blue Dog Mead - Eugene, Oregon Sep 2011 - Oct 2012
Co-Owner/Head of Sales UO Lundquist College of Business Jun 2011 - Mar 2012
Assistant Webmaster Oregon Entrepreneurship Club - Eugene, Oregon Area Jun 2011 - Feb 2012
Webmaster/Member University of Oregon Feb 2010 - May 2010
Student Assistant Volunteer Adventure Corps Apr 2009 - Sep 2009
Program Facilitator Marine Coastal Management - Cape Town Area, South Africa Sep 2008 - Dec 2008
Intern

Education:

University of Oregon 2007 - 2012
B.S., General Business, Philosophy, Entrepreneurship, Leadership in the Outdoors Cleveland High School 2003 - 2007

Skills:

Marketing, Email Marketing, Marketing Strategy, Hubspot, Marketo, Eloqua, Digital Marketing, Salesforce.com, Social Media Marketing, Sales, Leadership, Management, Google Analytics, Google Adwords, Marketing Communications, Analytics, Online Marketing, Pardot, Web Design, Wordpress, Photoshop, Blogging, Illustrator, Web Development, Css, Javascript, Social Media, Social Networking, Strategic Planning, Lead Generation

Interests:

Leadership
Mead
Scuba Diving
Self Development
Arts and Culture
Health
Backpacking
Snowboarding
Education
Environment
Science and Technology
Human Rights
Local Art
Civil Rights and Social Action
Hiking
Disaster and Humanitarian Relief
Wine
Economic Empowerment
Politics
Jazz
Craft Beer
International Traveling

Certifications:

Digital Analytics Fundamentals
Google

Simon Spencer

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Phones & Addresses

Name

Addresses

Phones

Simon C Spencer

174 Silver Birch Ln, Collinsville, VA 24078

276-647-7077

Simon C Spencer

181 Oakwood Dr, Martinsville, VA 24112

276-957-2018

Simon B Spencer

10201 Jenaro St, Albuquerque, NM 87121

505-831-0512, 505-836-0720

Simon C Spencer

215 Patricia Dr, Martinsville, VA 24112

276-957-2018, 276-957-4619, 540-957-2018

Simon P Spencer

16420 Al Philpott Hwy, Martinsville, VA 24112

276-957-2897

Simon C Spencer

1667 Hidden Hills Ct, Stone Mountain, GA 30088

770-593-0204, 770-808-8200, 770-981-9036

Simon Spencer

220 Crestview Dr, Albuquerque, NM 87105

505-836-0720

Simon Spencer

4913 Meadow Dr, Dulce, NM 87528

505-759-1922, 505-759-3707

Publications

Us Patents

Method For Determining Root Cause Affecting Yield In A Semiconductor Manufacturing Process

US Patent:

2021038, Dec 16, 2021

Filed:

Nov 4, 2019

Appl. No.:

17/295193

Inventors:

- Veldhoven, NL
Cyrus Emil TABERY - San Jose CA, US
Hakki Ergün CEKLI - Eindhove, NL
Simon Philip Spencer HASTINGS - San Jose CA, US
Boris MENCHTCHIKOV - Redwood City CA, US
Yi ZOU - Foster City CA, US
Yana CHENG - San Jose CA, US
Maxime Philippe Frederic GENIN - San Mateo CA, US
Tzu-Chao CHEN - Dublin CA, US
Davit HARUTYUNYAN - San Jose CA, US
Youping ZHANG - Cupertino CA, US

Assignee:

ASML NETHERLANDS B.V. - Veldhoven

International Classification:

G03F 7/20
G05B 13/02
G05B 19/418
H01L 21/66

Abstract:

A method for determining a root cause affecting yield in a process for manufacturing devices on a substrate, the method including: obtaining yield distribution data including a distribution of a yield parameter across the substrate or part thereof; obtaining sets of metrology data, each set including a spatial variation of a process parameter over the substrate or part thereof corresponding to a different layer of the substrate; comparing the yield distribution data and metrology data based on a similarity metric describing a spatial similarity between the yield distribution data and an individual set out of the sets of the metrology data; and determining a first similar set of metrology data out of the sets of metrology data, being the first set of metrology data in terms of processing order for the corresponding layers, which is determined to be similar to the yield distribution data.

Method Of Manufacturing Devices

US Patent:

2021039, Dec 23, 2021

Filed:

Oct 30, 2019

Appl. No.:

17/296316

Inventors:

- Veldhoven, NL
Wim Tjibbo TEL - Helmond, NL
Daan Maurits SLOTBOOM - Wolphaartsdijk, NL
Vadim Yourievich TIMOSHKOV - Veldhoven, NL
Koen Wilhelmus Cornelis Adrianus VAN DER STRATEN - Oud Gastel, NL
Boris MENCHTCHIKOV - Redwood City CA, US
Simon Philip Spencer HASTINGS - San Jose CA, US
Cyrus Emil TABERY - San Jose CA, US
Maxime Philippe Frederic GENIN - San Mateo CA, US
Youping ZHANG - Cupertino CA, US
Yi ZOU - Foster City CA, US
Chenxi LIN - Newark CA, US
Yana CHENG - San Jose CA, US

Assignee:

ASML NETHERLANDS B.V. - Veldhoven

International Classification:

G05B 19/418

Abstract:

A method for analyzing a process, the method including obtaining a multi-dimensional probability density function representing an expected distribution of values for a plurality of process parameters; obtaining a performance function relating values of the process parameters to a performance metric of the process; and using the performance function to map the probability density function to a performance probability function having the process parameters as arguments.

Method To Predict Yield Of A Device Manufacturing Process

US Patent:

2020010, Apr 2, 2020

Filed:

Mar 29, 2018

Appl. No.:

16/497826

Inventors:

- Veldhoven, NL
Cyrus Emil TABERY - San Jose CA, US
Simon Hendrik Celine VAN GORP - Oud-Turnhout, BE
Chenxi LIN - Newark CA, US
Dag SONNTAG - Eindhoven, NL
Hakki Ergün CEKLI - Singapore, SG
Ruben ALVAREZ SANCHEZ - Veldhoven, NL
Shih-Chin LIU - Eindhoven, NL
Simon Philip Spencer HASTINGS - San Jose CA, US
Boris MENCHTCHIKOV - Redwood City CA, US
Christiaan Theodoor DE RUTTER - Eindhoven, NL
Peter TEN BERGE - Eindhoven, NL
Michael James LERCEL - Fishkill NY, US
Wei DUAN - Eindhoven, NL
Pierre-Yves Jerome Yvan GUITTET - Veldhoven, NL

Assignee:

ASML NETHERLANDS B.V. - Veldhoven

International Classification:

G03F 7/20

Abstract:

A method and associated computer program for predicting an electrical characteristic of a substrate subject to a process. The method includes determining a sensitivity of the electrical characteristic to a process characteristic, based on analysis of electrical metrology data including electrical characteristic measurements from previously processed substrates and of process metrology data including measurements of at least one parameter related to the process characteristic measured from the previously processed substrates; obtaining process metrology data related to the substrate describing the at least one parameter; and predicting the electrical characteristic of the substrate based on the sensitivity and the process metrology data.

Voltage Contrast Metrology Mark

US Patent:

2021008, Mar 25, 2021

Filed:

Dec 7, 2018

Appl. No.:

16/772022

Inventors:

- Veldhoven, NL
Simon Hendrik Celine VAN GORP - Oud-Turnhout, BE
Simon Philip Spencer HASTINGS - San Jose CA, US
Brennan PETERSON - Longmont CO, US

International Classification:

G03F 7/20
H01L 21/66
H01L 23/544

Abstract:

A measurement mark is disclosed. According to certain embodiments, the measurement mark includes a set of first test structures developed in a first layer on a substrate, each of the set of first test structures comprising a plurality of first features made of first conducting material. The measurement mark also includes a set of second test structures developed in a second layer adjacent to the first layer, each of the set of second test structures comprising a plurality of second features made of second conducting material. The measurement mark is configured to indicate connectivity between the set of first test structures and associated second test structures in the set of second test structures when imaged using a voltage-contrast imaging method.

Method To Predict Yield Of A Device Manufacturing Process

US Patent:

2021032, Oct 21, 2021

Filed:

Jun 30, 2021

Appl. No.:

17/363057

Inventors:

- Veldhoven, NL
Cyrus Emil TABERY - San Jose CA, US
Simon Hendrik Celine VAN GORP - Oud-Turnhout, BE
Chenxi LIN - Newark CA, US
Dag SONNTAG - Eindhoven, NL
Hakki Ergün CEKLI - SINGAPORE, SG
Ruben ALVAREZ SANCHEZ - Veldhoven, NL
Shih-Chin LIU - Eindhoven, NL
Simon Philip Spencer HASTINGS - San Jose CA, US
Boris MENCHTCHIKOV - Redwood City CA, US
Christiaan Theodoor DE RUITER - Eindhoven, NL
Peter TEN BERGE - Eindhoven, NL
Michael James LERCEL - Fishkill NY, US
Wei DUAN - Eindhoven, NL
Pierre-Yves Jerome Yvan GUITTET - Veldhoven, NL

Assignee:

ASML NETHERLANDS B.V. - Veldhoven

International Classification:

G03F 7/20

Abstract:

Videos & Images

FAQ: Learn more about Simon Spencer

What are the previous addresses of Simon Spencer?

Previous addresses associated with Simon Spencer include: 1221 E Lakeshore Dr, Landrum, SC 29356; 1260 Alexander, Sn Bernrdno, CA 92405; 10201 Jenaro St Sw, Albuquerque, NM 87121; 1667 Hidden Hills, Stone Mountain, GA 30088; 5005 Sollars, Muncie, IN 47304. Remember that this information might not be complete or up-to-date.

Where does Simon Spencer live?

Hastings on Hudson, NY is the place where Simon Spencer currently lives.

How old is Simon Spencer?

Simon Spencer is 64 years old.

What is Simon Spencer date of birth?

Simon Spencer was born on 1959.

What is Simon Spencer's email?

Simon Spencer has such email addresses: simonspen***@gmail.com, simon.spen***@att.net. Note that the accuracy of these emails may vary and they are subject to privacy laws and restrictions.

What is Simon Spencer's telephone number?

Simon Spencer's known telephone numbers are: 503-234-1722, 919-237-3625, 909-886-0420, 505-831-0512, 505-836-0720, 770-593-0204. However, these numbers are subject to change and privacy restrictions.

How is Simon Spencer also known?

Simon Spencer is also known as: Lorraine O Spencer, Simon R, Simon D Spenser, Simon L Spenser, Lorraine O Spenser, Lorraine S Simon. These names can be aliases, nicknames, or other names they have used.

Who is Simon Spencer related to?

Known relatives of Simon Spencer are: Jonathan Buckley, Lorraine Spenser, Roger Spenser, Thomas Spenser, Timothy Spenser. This information is based on available public records.

What are Simon Spencer's alternative names?

Known alternative names for Simon Spencer are: Jonathan Buckley, Lorraine Spenser, Roger Spenser, Thomas Spenser, Timothy Spenser. These can be aliases, maiden names, or nicknames.

What is Simon Spencer's current residential address?

Simon Spencer's current known residential address is: 75 Edgars Ln, Hastings on Hudson, NY 10706. Please note this is subject to privacy laws and may not be current.

Name Variants	Si Spencer	Sy Spencer	Sim Spencer
Ages	35 to 88
Phones	503-234-1722	919-237-3625	909-886-0420
Addresses	1423 Se 53Rd Ave, Portland, OR 97215	1221 E Lakeshore Dr, Landrum, SC 29356	1260 Alexander, Sn Bernrdno, CA 92405
Business records	Digital Solutions Architect / Lead Lizard	Senior Software Engineer / Netflix

Simon Spencer

What do we know about Simon Spencer

Public information about Simon Spencer

Resumes

Resumes

E-Commerce Professional

Simon Spencer - Madrid, IA

Senior Software Engineer

Senior Marketing Manager

Simon Spencer

Phones & Addresses

Publications

Us Patents

Method For Determining Root Cause Affecting Yield In A Semiconductor Manufacturing Process

Method Of Manufacturing Devices

Method To Predict Yield Of A Device Manufacturing Process

Voltage Contrast Metrology Mark

Method To Predict Yield Of A Device Manufacturing Process

FAQ: Learn more about Simon Spencer

Possible Relatives