Michael Fossey

In the United States, there are 16 individuals named Michael Fossey spread across 17 states, with the largest populations residing in Oregon, Massachusetts, Arizona.

Last updated 2024-02-18

Public information about Michael Fossey

Phones & Addresses

Name

Addresses

Phones

Michael Fossey

16031 Copper Crest Ln, Sun City, AZ 85374

623-414-3744

Michael Fossey

525 Harrison St, Avondale, AZ 85323

623-328-5738

Michael F Fossey

8 Quarry Hill Rd, Graniteville, MA 01886

978-496-0616

Michael Fossey

14800 Cornell Rd, Portland, OR 97229

503-439-1069

Michael H Fossey

39 Castlewood Dr, Billerica, MA 01821

978-663-6762

Michael D Fossey

807 1St St, Saint Ansgar, IA 50472

641-736-4475

Michael T Fossey

2226 Parkside Ln, Phoenix, AZ 85024

480-473-2068, 480-563-5210, 602-563-5210

Michael T Fossey

4719 Preserve Way, Cave Creek, AZ 85331

480-502-3721

Publications

Us Patents

Smoke Detector With Digital Display

US Patent:

5565852, Oct 15, 1996

Filed:

Jul 13, 1994

Appl. No.:

8/274922

Inventors:

Mark A. Peltier - Sherwood OR
Douglas H. Marman - Ridgefield WA
David S. Terrett - Hickory NC
Michael E. Fossey - Charlotte NC

Assignee:

Sentrol, Inc. - Tualatin OR

International Classification:

G08B 1900

US Classification:

340632

Abstract:

An improved environmental alarm system has centralized control of local sensor display capabilities displays, on the sensor itself, a variety of sensor data including sensor address, and detected levels of one or more environmental conditions. Alphanumeric characters are displayed at individual sensors in response to commands from a master microprocessor directing local sensor display content and timing. A local microcontroller within each sensor interprets the detected signal and prepares a resulting data signal that is available for downloading into the alphanumeric display in compliance with a coded message from the master microprocessor.

Wafer Inspection System For Distinguishing Pits And Particles

US Patent:

6292259, Sep 18, 2001

Filed:

Jul 24, 2000

Appl. No.:

9/624502

Inventors:

Michael E. Fossey - Charlotte NC
John C. Stover - Charlotte NC

Assignee:

ADE Optical Systems Corporation - Charlotte NC

International Classification:

G01N 2100

US Classification:

3562372

Abstract:

A surface inspection system and method is provided which detects defects such as particles or pits on the surface of a workpiece, such as a silicon wafer, and also distinguishes between pit defects and particle defects. The surface inspection system comprises an inspection station for receiving a workpiece and a scanner positioned and arranged to scan a surface of the workpiece at the inspection station. The scanner includes a light source arranged to project a beam of P-polarized light and a scanner positioned to scan the P-polarized light beam across the surface of the workpiece. The system further provides for detecting differences in the angular distribution of the light scattered from the workpiece and for distinguishing particle defects from pit defects based upon these differences.

Wafer Inspection System For Distinguishing Pits And Particles

US Patent:

6509965, Jan 21, 2003

Filed:

Jul 17, 2001

Appl. No.:

09/906062

Inventors:

Michael E. Fossey - Newbury Park CA
John C. Stover - Charlotte NC
Lee D. Clementi - Lake Wylie SC

Assignee:

ADE Optical Systems Corporation - Charlotte NC

International Classification:

G01N 2100

US Classification:

3562372, 356343, 356364, 3562374

Abstract:

Methods And Apparatus For Identifying The Material Of A Particle Occurring On The Surface Of A Substrate

US Patent:

6122047, Sep 19, 2000

Filed:

Jan 14, 1999

Appl. No.:

9/231685

Inventors:

John C. Stover - Charlotte NC
Songping Gao - Southborough MA
Michael E. Fossey - Woodland Hills CA
Lee Dante Clementi - Lake Wylie SC

Assignee:

ADE Optical Systems Corporation - Charlotte NC

International Classification:

G01N 2188

US Classification:

3562373

Abstract:

The composition of a particle occurring on the surface of a smooth substrate is identified by impinging the surface with a light beam having a strong P-polarized component at an oblique angle of incidence to the surface, and collecting light scattered from the surface at forward, center, and back locations relative to the portion of the surface impinged by the incident beam. The intensities of the light collected at these locations are measured by detectors and converted into signals, and the magnitudes of the signals are compared to correlations of particle material as a function of the relative magnitudes of the forward-, center-, and back-scatter signals so as to identify the material whose correlation most nearly matches the measured detector signals. Preferably, a ratio of the back detector signal magnitude to forward detector signal magnitude is correlated with particle material and back detector signal magnitude. Alternatively or additionally, a ratio of back detector signal magnitude to center detector signal magnitude is correlated with particle material and back detector signal magnitude.

Imaging Range Finder And Method

US Patent:

4916536, Apr 10, 1990

Filed:

Nov 7, 1988

Appl. No.:

7/268337

Inventors:

James R. Kerr - Tigard OR
Michael E. Fossey - Beaverton OR
David M. Aikens - Pleasanton CA
Bruce L. Cannon - Lake Oswego OR
John J. McDonald - West Linn OR

Assignee:

FLIR Systems, Inc. - Portland OR

International Classification:

H04N 718

US Classification:

358107

Abstract:

The imaging range finder of the invention includes a radiation transmitter, a transmitting section and a receiving section. The transmitting section directs radiation across an angular field of view by a first rotating mirror having a plurality of facets. The receiving section includes a second rotating mirror also with a plurality of facets which collects any reflected radiation. An image is produced by measuring the intensity of the reflected radiation at numerous points in the field of view. Range is determined by radiation modulation. Range may be determined more precisely at shorter ranges by modulating the radiation to produce two subcarriers and using one subcarrier to supply short range information. The finder is stabilized to preserve imaging and range finding accuracy when it is exposed to vibration or pitch-angle disturbance. The invention also discloses a method of imaging and range finding over very wide angles and at standard picture frame frequencies.

System For And Method Of Synchronous Acquisition Of Pulsed Source Light In Performance Of Monitoring Aircraft Flight Operation

US Patent:

7705879, Apr 27, 2010

Filed:

Feb 13, 2007

Appl. No.:

12/279158

Inventors:

J. Richard Kerr - West Linn OR, US
Gregory A. Zuro - Portland OR, US
Michael E. Fossey - Portland OR, US

Assignee:

Max-Viz, Inc. - Portland OR

International Classification:

H04N 7/18
H04N 7/00

US Classification:

348117, 348119, 348116, 348113, 348123, 348471, 250330

Abstract:

A system for and a method of synchronous acquisition of pulsed source light performs monitoring of aircraft flight operation. Diode sources of illumination () are pulsed () at one-half the video frame rate of an imaging camera (). Alternate frames view the world-scene with lights of interest pulsed on, and then off, respectively. Video differencing () eliminates the background scene, as well as all lights not of interest. Suitable threshholding over a resulting array of camera pixel-differences acquires the desired lights and represents them as point symbology on a display (). In an enhanced vision landing system embodiment, the desired lights (symbols) overlay or are fused on a thermal image of the scene; alternatively, the symbols overlay a visible scene (TV) image.

Method And Apparatus For Detecting Control System Data Processing Errors

US Patent:

4698785, Oct 6, 1987

Filed:

Dec 2, 1983

Appl. No.:

6/557631

Inventors:

John P. Desmond - Hillsboro OR
Douglas W. Ford - Hillsboro OR
Michael E. Fossey - Forest Grove OR
Michael Stanbro - Tigard OR
Kenneth A. Zimmerman - Beaverton OR

International Classification:

G06F 1116

US Classification:

364900

Abstract:

A digital-based control data processing system detects during system operation the occurrence of data processing errors. Data processing accuracy is verified by receiving output information developed from system input information in accordance with a first operational function, computing a derived version of the system input information in accordance with a second operational function, and comparing the derived version of the system input information to the actual system input information to determine whether they differ by a predetermined operational tolerance. This method for verifying processing accuracy is especially advantageous for detecting latent software errors which are unique to a particular computer program. The processing system includes display apparatus which develops from the output information a set of display symbols that convey the information on a monitor screen to the pilot. Assigned to each display symbol is an identifying tag which identifies in real time a display symbol that conveys erroneous information.

Surface Inspection System And Method Of Inspecting Surface Of Workpiece

US Patent:

5712701, Jan 27, 1998

Filed:

Mar 6, 1995

Appl. No.:

8/399962

Inventors:

Lee D. Clementi - Lake Wylie SC
Michael E. Fossey - Charlotte NC

Assignee:

ADE Optical Systems Corporation - Charlotte NC

International Classification:

G01N 2188

US Classification:

356237

Abstract:

A surface inspection system and methods of inspecting a surface of a workpiece are provided for detecting particles, defects, or other surface characteristics in or on a surface of the workpiece. The surface inspection system preferably has a transporter arranged for transporting a workpiece along a material path and a rotator associated with the transporter and arranged for rotating a workpiece during translational travel along the material path. A scanner is positioned and arranged for scanning a surface of a workpiece during rotational and translational travel along the material path. The scanner preferably includes a light source arranged to generate a light beam therefrom and a deflector positioned to receive the light beam and arranged for deflecting the light beam along a predetermined scan path across a surface of the workpiece as the workpiece rotationally and translationally travels along the material path. A collector also is preferably arranged for collecting light specularly reflected and scattered from the surface of the workpiece during rotational and translational travel along the material path.

Videos & Images

How old is Michael Fossey?

Michael Fossey is 49 years old.

What is Michael Fossey date of birth?

Michael Fossey was born on 1974.

What is Michael Fossey's email?

Michael Fossey has such email addresses: mfos***@earthlink.net, mfos***@prodigy.net. Note that the accuracy of these emails may vary and they are subject to privacy laws and restrictions.

What is Michael Fossey's telephone number?

Michael Fossey's known telephone numbers are: 978-496-0616, 507-396-2790, 641-736-4475, 808-883-9362, 704-542-4784, 360-834-1272. However, these numbers are subject to change and privacy restrictions.

How is Michael Fossey also known?

Michael Fossey is also known as: Michael John Fossey, Mike J Fossey. These names can be aliases, nicknames, or other names they have used.

Who is Michael Fossey related to?

Known relatives of Michael Fossey are: John Fossey, Nikki Fossey, Justin Kidder, Robert Sikkink, Amy Sikkink, Mary Bemboom, William Bemboom. This information is based on available public records.

What are Michael Fossey's alternative names?

Known alternative names for Michael Fossey are: John Fossey, Nikki Fossey, Justin Kidder, Robert Sikkink, Amy Sikkink, Mary Bemboom, William Bemboom. These can be aliases, maiden names, or nicknames.

Possible Relatives

John Fossey Michael Last Michael Stamps Michael Stan Michael Stanage Michael Stanaland Michael Stanard Michael Stanberry Michael Stanbery Michael Stanbro

Name Variants	Mikael Fossey	Mychael Fossey	Mike Fossey
Ages	33 to 72
Phones	978-496-0616	507-396-2790	641-736-4475
Addresses	8 Quarry Hill Rd, Westford, MA 01886	400 20Th St Nw, Austin, MN 55912	15370 Bayberry Ave, Ventura, IA 50482
Business records	Furniture Maker	Chief Executive Officer, Owner / Northwest System Design LLC Business Services	Principal / Patient Advocate Services LLC Services-Misc

Michael Fossey

What do we know about Michael Fossey

Public information about Michael Fossey

Phones & Addresses

Publications

Us Patents

Smoke Detector With Digital Display

Wafer Inspection System For Distinguishing Pits And Particles

Wafer Inspection System For Distinguishing Pits And Particles

Methods And Apparatus For Identifying The Material Of A Particle Occurring On The Surface Of A Substrate

Imaging Range Finder And Method

System For And Method Of Synchronous Acquisition Of Pulsed Source Light In Performance Of Monitoring Aircraft Flight Operation

Method And Apparatus For Detecting Control System Data Processing Errors

Surface Inspection System And Method Of Inspecting Surface Of Workpiece

FAQ: Learn more about Michael Fossey

Possible Relatives